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Proceeding

 

査読付き学会プロシーディング

 

2006

  • Combinatorial exploration of flux material for Bi4Ti3O12 single crystal film growth

        R. Takahashi, Y. Yonezawa, M. Ohtani, M. Kawasaki, Y. Matsumoto, H. Koinuma

        Applied Surface Science, 252, 2477-2481 (2006)

 

  • Flux-mediated epitaxy for ferroelectric Bi4Ti3O12 single crystal film growth

        R. Takahashi, Y. Yonezawa, Y. Matsumoto, H. Koinuma

        Journal of Electroceramics, 17, 189-195 (2006)

 

  • High-throughput characterization of local conductivity of Nd0.9Ca0.1Ba2Cu3O7-d thin film by the low-temperature scanning microwave microscope

        S. Okazaki, N. Okazaki, X. Zhao, H. Sugaya, S. Yaginuma, R. Takahashi, M. Murakami, Y. Matsumoto, T. Chikyow, H. Koinuma and

        T. Hasegawa

        Applied Surface Science, 252, 2615-2621 (2006)

 

  • Combinatorial approach to exploration of a novel fluid oxide flux stable in vacuum for material processing

        Y. Matsumoto, H. Koinuma, Y. Tsuruta, R. Takahashi

        Material Research Society Symposium Proceeding, 894, LL01-05

 

  • Development of variable temperature scanning microwave microscope for high throughput materials characterization

        N. Okazaki, S. Okazaki, R. Takahashi, M. Murakami, P. Ahmet, N. Kakiuchi, H. Furusho, T. Nishino, Y. Furubayashi, T. Fukumura,

        Y. Mastumoto, M. Kawasaki, T. Chikyow, H. Koinuma and T. Hasegawa

        Material Research Society Symposium Proceeding, 894, LL02-03

 

2005

  • Flux-mediated epitaxy: general application in vapor phase epitaxy to single crystal quality of complex oxide films

        Y. Matsumoto, R. Takahashi, H. Koinuma

        Journal of Crystal Growth, 275, 325-330 (2005)

 

  • Surface termination effect on the photocatalysis on atomically controlled SrTiO3(001) surface

        Y. Matsumoto, T. Ohsawa, R. Takahashi, H. Koinuma

        Thin Solid Films, 486, 11-14 (2005)

 

  • Structure of NiO and Li-doped NiO single crystalline layers with atomically flat surface

        U. S. Joshi, R. Takahashi, Y. Matsumoto, and H. Koinuma

        Thin Solid Films, 486, 214-217 (2005)

 

2004

  • Development of a new combinatorial mask for addressable ternary phase diagramming

        R. Takahashi, H. Kubota, T. Tanigawa, M. Murakami, Y. Yamamoto, Y. Matsumoto, H. Koinuma

        Applied Surface Science, 223, 249-252 (2004).

 

  • Combinatorial synthesis of RECa4O(BO3)3 epitaxial thin films and its luminescent characteristics

        H. Kubota, R. Takahashi, T.-W. Kim, N. Arai, M. Yoshimura, H. Nakao, H. Furuya, Y. Mori, T. Sasaki, Y. Matsumoto, H. Koinuma

        Applied Surface Science, 223, 241-244 (2004).

 

  • Mathematical design of linear action masks for binary and ternary composition spread film library

        Y. Yamamoto, R. Takahashi, Y. Matsumoto, T. Chikyow, H. Koinuma

        Applied Surface Science, 223, 9-13 (2004).

 

  • High-throughput screening of flux materials for single crystal growth by combinatorial pulsed Laser deposition

        R. Takahashi, T. Tanigawa, Y. Yamamoto, Y. Yonezawa Y. Matsumoto, H. Koinuma

        Material Research Society Symposium Proceeding, 804 JJ9.20.1-6 (2004)  

 

2002

  • Combinatorial optimization of atomically controlled growth for oxide films by the carrousel type laser molecular beam epitaxy 

        R. Takahashi, Y. Matsumoto, M. Lippmaa, M. Kawasaki and H. Koinuma

        Applied Surface Science, 197-198, 532 (2002)

 

  • Combinatorial optimization of atomically controlled growth for oxide films by the carrousel type laser molecular beam epitaxy

        R. Takahashi, Y. Matsumoto, M. Lippmaa, M. Kawasaki and H. Koinuma

        Material Research Society Symposium Proceeding 700 (2002) S1. 4

 

  • Development of combinatorial PLD-STM system for the quick nano-fabrication and evaluation

        Y. Matsumoto, T. Ohsawa, R. Takahashi, H. Koinuma

        Material Research Society Symposium Proceeding 700 (2002) S1. 1

 

  • High throughput characterization of magnetic semiconductor thin films with a scanning SQUID microscope

        X. J. Fan, M. Murakami, R. Takahashi, T. Koida, Y. Matsumoto, T. Hasegawa, T. Fukumura, M. Kawasaki, P. Ahmet, T. Chikyow and

        H. Koinuma

        Material Research Society Symposium Proceeding 700 (2002) S2. 7

 

  • Combinatorial search for transparent oxide diluted magnetic semiconductors

        T. Fukumura, M. Kawasaki, Z. Jin, H. Kimura, Y. Yamada, M. Haemori, Y. Matsumoto, K. Inaba, M. Murakami, R. Takahashi,

        T. Hasegawa, H. Koinuma

        Material Research Society Symposium Proceeding 700 (2002) S2. 6. 1

 

 

査読なし学会プロシーディング

 

  • EELS and HAADF-STEM studies of the PbTiO3/SrTiO3 interface in ferroelectric thin films

        E. Eberg, A. T. J. van Helvoort, R. Takahashi, M. Gass, B. Mendis, A. Bleloch, T. Tybell and R.Holmestad

        Physical Properties and Application of Advanced Materials, 124-126 (2011)

        Shanghai University Press, Proceedings of ICPMAT-VI

 

  • Innovative concepts and methodologies of materials research

        Hideomi Koinuma, Ryota Takahashi

        Transactions of the Materials Research Society of Japan, 29, 49-52 (2004)

 

  • High-throughput screening of binary and ternary dielectric oxides by combinatorial technology

        H. Koinuma, R. Takahashi, Y. Yamamoto, H. Minami, K. Itaka, Y. Matsumoto, K. Hasegawa, T. Chikyow

        Proceeding of the Electrochemical Society 2003 Spring in Paris, p323

 

  • Thermodynamically steady-state growth of NdBa2Cu3O7-δ single crystalline films by Tri-phase epitaxy

        Y. Matsumoto, K. S. Yun, R. Takahashi, J. H. Song, B. D. Choi, T. Itoh, P. Ahmet, K. Nakajima, T. Chikyow, H. Koinuma and

        M. Kawasaki

        Proceeding of the Fifth Symposium on Atomic-scale Surface and Interface Dynamics, March 323(2001)

 

  • The x-ray diffraction mapping of thin films with concurrent x-ray diffractometer

        M. Ohtani, T. Fukumura, M. Lippmaa, R. Takahashi, Y. Matsumoto, M. Kawasaki, H. Koinuma, K. Omote, T. Kikuchi, and J. Harada

        Proceeding of the Fifth Symposium on Atomic-scale Surface and Interface Dynamics, March 335(2001)

 

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